Integrity in Electronic Design - ANSYS Seminar Sponsored by IEEE Cleveland Section

This presentation addresses the relationship between Signal Integrity (SI), Power Integrity (PI) and Electromagnetic Interference (EMI). It presents how state-of-the-art electromagnetic analysis tools, such as ANSYS HFSS, SIwave, and Designer, can be used to diagnose and correct the causes of Signal Integrity and Power Integrity issues.

Lastly, the presentation shows the correlation between measurement and simulation results with regard to PDN design, SI design and EMI.

This event will be held at:

Mavis Winkles, 5005 Rockside Road, Independence, OH

Wednesday, May 29 from 5:30PM to 7:30 PM

Cost: FREE

Food and beverages will be provided so please come and attend and learn about Ansys’s newest products and capabilities and how they can assist you in your communication needs.

There is a limited number of seats for this event so please RSVP at http://www.clevelandieee.org/ansys-rsvp-may2013 as soon as possible so you do not miss out. Have your friends and colleagues RSVP for this event as well!

 

Integrity in
Electronic Design

 

ANSYS Seminar: Integrity in Electronic Design

This presentation addresses the relationship between Signal Integrity (SI), Power Integrity (PI) and Electromagnetic Interference (EMI). It presents how state-of-the-art electromagnetic analysis tools, such as ANSYS HFSS, SIwave, and Designer, can be used to diagnose and correct the causes of Signal Integrity and Power Integrity issues.

It discusses the trends in modern Power Delivery Networks (PDN) for packages and PCBs, and how these trends drive designs. We clearly demonstrate the relationship between PI and EMI and show how a proper decoupling capacitor strategy can provide better power integrity and reduce EMI.

Additionally, the presentation discusses Signal Integrity (SI) issues and how poor SI designs can also contribute to EMI. The presentation then focuses on how simple to use simulation tools can be used to improve the signal integrity of your designs and how proper signal integrity design can improve performance and reduce EMI issues.

Lastly, the presentation shows the correlation between measurement and simulation results with regard to PDN design, SI design and EMI.

Markus Kopp Bio

The Presenter, Markus Kopp, is a Lead Application Specialist for the ANSYS Electronics high frequency products, which includes tools such as HFSS, SIwave, and Designer. During the past 13 years, while working at Ansoft/ANSYS he has progressively held the roles of Application Engineer, Country Manager and Senior Application Specialist, focusing on the high frequency simulation tools and markets.

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